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Archive: 07/05/2004

Samsung Electronics Develops Wafer Level Package for Higher Chip Performance

Samsung Electronics Co., Ltd., the world leader in advanced semiconductor memory technology, recently announced the industry's first wafer level package (WLP) for high-performance 512Megabit (Mb) DDR2 SDRAMs. WLP, unlike ...

Technology /

created Jul 05, 2004 | popularity 5 / 5 (1) | comments 0

Micron Announces Plans to Produce NAND Flash Memory Products

Boise, ID July 5, 2004 – Micron Technology, Inc., today announced plans to produce NAND Flash memory solutions targeting memory cards, USB devices and other mass storage applications. The growing demand for high-performance, ...

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created Jul 05, 2004 | popularity not rated yet | comments 0

New Separation Technology With Carbon Dioxide Is Cleaner And Cheaper

Researchers of Wageningen University and Research Centre in the Netherlands have developed a new clean, process to isolate valuable or undesired components from solids, such as components for food products. In contrast to ...

Technology /

created Jul 05, 2004 | popularity 4 / 5 (2) | comments 0

Beating the Thieves With Location Tracking Technology

Police aim to 'design out' crime by equipping valuable items with tracking devices that sound an alert or record their movement. They are being helped by electronic engineers at the University of Leeds who are devising a ...

Technology /

created Jul 05, 2004 | popularity not rated yet | comments 0

Samsung Electronics Unveils Next-generation Technology Breakthroughs

Samsung Electronics Co., Ltd., a leader in advanced semiconductor technology, presented a wide range of core next-generation technologies at the 2004 Symposia on VLSI Technology and Circuits, being held in Honolulu June 15-19. ...

Technology /

created Jul 05, 2004 | popularity 2 / 5 (1) | comments 0

New Technology Could Transform Every Train into A High Speed Cracked Rail Detector

Researchers in the University of Warwick’s Department of Physics have developed a novel non-contact method of using ultrasound to detect and measure cracks and flaws in rail track – particularly gauge corner ...

Physics /

created Jul 05, 2004 | popularity not rated yet | comments 0


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