Super-Resolution X-ray Microscopy unveils the buried secrets of the nanoworld

A novel super-resolution X-ray microscope developed by a team of researchers from the Paul Scherrer Institut (PSI) and EPFL in Switzerland combines the high penetration power of x-rays with high spatial resolution, making it possible for the first time to shed light on the detailed interior composition of semiconductor devices and cellular structures.

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<p><a href="http://www.physorg.com/news135523216.html">Super-Resolution X-ray Microscopy unveils the buried secrets of the nanoworld</a></p> <p>A novel super-resolution X-ray microscope developed by a team of researchers from the Paul Scherrer Institut (PSI) and EPFL in Switzerland combines the high penetration power of x-rays with high spatial resolution, making it possible for the first time to shed light on the detailed interior composition of semiconductor devices and cellular structures.</p>