Stretching silicon: A new method to measure how strain affects semiconductors

(PhysOrg.com) -- University of Wisconsin-Madison engineers and physicists have developed a method of measuring how strain affects thin films of silicon that could lay the foundation for faster flexible electronics.

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<p><a href="http://www.physorg.com/news144949834.html">Stretching silicon: A new method to measure how strain affects semiconductors</a></p> <p>(PhysOrg.com) -- University of Wisconsin-Madison engineers and physicists have developed a method of measuring how strain affects thin films of silicon that could lay the foundation for faster flexible electronics.</p>