New statistical technique improves precision of nanotechnology data

A new statistical analysis technique that identifies and removes systematic bias, noise and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have future industrial applications.

If you want to include this story in your blog, copy and paste this formatted text:

<p><a href="http://www.physorg.com/news165669132.html">New statistical technique improves precision of nanotechnology data</a></p> <p>A new statistical analysis technique that identifies and removes systematic bias, noise and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have future industrial applications.</p>