AMRC Developing Nano-Metrology to Probe Chip Structures at Atomic Level

Engineers at the Advanced Materials Research Center (AMRC) in Austin are investigating a nanoscale approach to metrology that will allow them to examine new semiconductor structures at the atomic level, and so prepare the way for next-generation electronics.

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<p><a href="http://www.physorg.com/news5867.html">AMRC Developing Nano-Metrology to Probe Chip Structures at Atomic Level</a></p> <p>Engineers at the Advanced Materials Research Center (AMRC) in Austin are investigating a nanoscale approach to metrology that will allow them to examine new semiconductor structures at the atomic level, and so prepare the way for next-generation electronics. </p>