New Hybrid Microscope Probes Nano-Electronics

A new form of scanning microscopy that simultaneously reveals physical and electronic profiles of metal nanostructures has been demonstrated at JILA, a joint institute of the National Institute of Standards and Technology (NIST) and University of Colorado at Boulder. The new instrument is expected to be particularly useful for analyzing the make-up and properties of nanoscale electronics and nanoparticles.

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<p><a href="http://www.physorg.com/news81172206.html">New Hybrid Microscope Probes Nano-Electronics</a></p> <p>A new form of scanning microscopy that simultaneously reveals physical and electronic profiles of metal nanostructures has been demonstrated at JILA, a joint institute of the National Institute of Standards and Technology (NIST) and University of Colorado at Boulder. The new instrument is expected to be particularly useful for analyzing the make-up and properties of nanoscale electronics and nanoparticles.</p>