New technique that improves the power of atomic force micrscopy

A team of researchers have developed a method that could vastly improve the ability of atomic force microscopes to "see" the chemical composition of a sample, follow variations of the sample, as well as map its topographic structure.

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<p><a href="http://www.physorg.com/news840.html">New technique that improves the power of atomic force micrscopy</a></p> <p>A team of researchers have developed a method that could vastly improve the ability of <a class="directory" href="http://www.physorg.com/search/AFM">atomic force microscopes</a> to "see" the chemical composition of a sample, follow variations of the sample, as well as map its topographic structure. </p>