Elpida Verifies the Physical Phenomena of Defect Repair Technology on a Microscopic Level

Elpida Memory announced recently that it has successfully developed defect repair technology that leads to dramatic improvement of data retention, and has also identified the physical phenomena that dominate DRAM retention characteristics by applying a technique known as electrically detected magnetic resonance (EDMR) for the first time. This research and development was done in conjunction with NEC Corporation's System Devices Research Laboratories, and the University of Tsukuba.