Infineon Completes Industry's First Test Chip for Fully Buffered DIMMs

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Infineon Demonstrates Leadership in Next Generation Server Memory Modules; Complements Industry´s First Test Chip for Fully
Infineon Technologies AG today announced that it has successfully tested the industry’s first advanced memory buffer ( AMB ) test chip for next generation server modules using Double Data Rate2 (DDR2) Dynamic Random Access Memory (DRAM). The AMB is the central part of fully buffered dual in-line memory modules (FB-DIMMs), which will be the new standard for server memory. By combining its in-house expertise in high-frequency chip design and DRAM technology to implement a complete solution Infineon gains a leadership position in the development of AMBs and FB-DIMMs.


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