New Hybrid Microscope Probes Nano-Electronics
User rating: 4.2 / 5 after 19 vote(s)
A false color SPIM image (b) reveals the same physical structure of a gold pattern on glass as an atomic force microscope image (a), but the high intensity regions in the SPIM image indicate that electron ejection is much more efficient at metal edge discontinuities. Credit: Credit: O.L.A. Monti, T.A. Baker, and D.J. Nesbitt/JILA
Full story »
|

PhysOrg Forum
Video
Editorials
Free Magazines
Newsletter
Goto Archive
Suggest a story idea
Send feedback