RFID testbed measures multiple tags at once and rapidly assesses new antenna designs

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Components of the testbed Georgia Techs Gregory Durgin developed to simultaneously measure hundreds of radio frequency identification RFID tags and rapidly test new RFID tag prototypes. Georgia Tech Photo: Gary Meek
Components of the testbed Georgia Tech's Gregory Durgin developed to simultaneously measure hundreds of radio frequency identification RFID tags and rapidly test new RFID tag prototypes. Georgia Tech Photo: Gary Meek

Researchers have designed a system capable of simultaneously measuring hundreds of radio frequency identification (RFID) tags and rapidly testing new RFID tag prototypes.


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