Swiss nano-microscope delivers first images recorded on Mars

The first image recorded by an atomic force microscope on another planet. On July 9, Mars day 44 of the Phoenix Mars Mission, the atomic force microscope on the Mars Lander recorded an image of a test grid, which serves as a calibration for the microscope. This image was successfully transmitted to Earth by the Phoenix Mars probe, and demonstrates full functionality of the nano-imaging device under the harsh Martian conditions, satisfying the NASA Phoenix team as well as the Swiss scientific team responsible for the development of the microscope. The area imaged by the microscope is 40 microns by 40 microns, small enough to fit on an eyelash. The grooves in this substrate are 14 microns (0.00055 inch) apart, from center to center. The vertical dimension is exaggerated in the image to make surface details more visible. The grooves are 300 nanometers (0.00001 inch) deep. Credit: NASA / JPL-Caltech / University of Arizona / University of Neuchatel