New X-Ray microbeam answers 20-year-old metals question
User rating: 4.7 / 5 after 24 vote(s)
Novel 3-D microbeam experiment enables direct proof of the Mughrabi model of metal stress. Submicron X-ray beam (broad arrow) penetrates a deformed copper single crystal and is diffracted onto a CCD detector. Platinum wire profiler (circle) traverses the sample and successively intercepts diffracted X-rays, providing depth measurement and allowing strains to be measured from individual dislocation cells. Credit: NIST
Full story »

PhysOrg Forum
Video
Editorials
Free Magazines
Newsletter
Goto Archive
Suggest a story idea
Send feedback