Researchers shine light on atomic transistor

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Electronmicroscopic image of FinFET transistor that was used for the research. Credit: TU Delft
Electronmicroscopic image of FinFET transistor that was used for the research. Credit: TU Delft

Researchers from TU Delft and the FOM Foundation (Netherlands) have successfully measured transport through a single atom in a transistor. This research offers new insights into the behaviour of so-called dopant atoms in silicon.


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All News summaries for November 22, 2006