Renesas, Matsushita Develop Technique for Stablizing Operation of 45nm On-Chip SRAM

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45nm On-Chip SRAM test chip.
45nm On-Chip SRAM test chip.

Renesas Technology and Matsushita Electric Industrial today announced the development of a technique that achieves stable operation with 45nm process generation bulk CMOS for SRAM (Static Random Access Memory) that can be embedded in SoC (system-on-a-chip) devices and microprocessors (MPUs).


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