<?xml version="1.0" encoding="iso-8859-1"?>
<?xml-stylesheet type="text/xsl" href="http://www.physorg.com/tmpl/default/css/default/feedRSS.xsl"?>
<rss version="2.0">
<channel>
<title>PHYSorg.com: PHYSorg news tagged with: positive charges</title>
<link>http://www.physorg.com/</link>
<language>en-us</language> 
<description>Physorg.com internet news portal provides the latest news on science including: Physics, Nanotechnology, Life Sciences, Space Science, Earth Science, Environment, Health and Medicine.</description>

 <item>
     <title>‘Electron Trapping` May Impact Future Microelectronics Measurements</title>
   	 <description>Using an ultra-fast method of measuring how a transistor switches from the `off` to the `on` state, researchers at the National Institute of Standards and Technology (NIST) recently reported that they have uncovered an unusual phenomenon that may impact how manufacturers estimate the lifetime of future nanoscale electronics. </description>
     <link>http://www.physorg.com/news133701665.html</link>
	 <category>Nanotechnology</category>
	 <pubDate>Thu, 26 Jun 2008 12:21:05 EST</pubDate>
	 <guid isPermaLink="false">news133701665</guid>
</item>


</channel>
</rss>

